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WideGap2001
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Doping Issues in Wide Band-Gap Semiconductors

Exeter, United Kingdom
21-23 March 2001
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Talk abstract

Optimization of p-doping in the MBE growth of GaN

James S. Speck

Materials Department and ECE Department, University of California, Santa Barbara, CA 93106, USA

Erik Haus, Yulia Smorchkova, Ben Heying, and Umesh Mishra

Materials Department and ECE Department, University of California, Santa Barbara, CA 93106, USA

In this talk, we cover three main results from our work on the optimization of MBE grown Mg-doped GaN: (1) optimization of growth conditions and resulting morphology; (2) transport properties and abruptness of doping; and (3) polarity inversion as a result of Mg doping. For these studies Mg layers were grown by plasma-assisted molecular-beam epitaxy at 650 °C . In the plasma-assisted MBE growth of nitrides, we show that optimal growth is realized for Ga-rich conditions at the cross-over from a Ga-wetting layer on the surface to conditions that give rise to droplets on the GaN surface. Growth under N-rich conditions resulted in either semi-insulating or n-type material. Secondary-ion-mass-spectroscopy measurements reveal uniform Mg doping profiles with very sharp boundaries. The amount of incorporated Mg atoms changes approximately linearly with incident Mg flux. Hall measurements on p-type GaN:Mg layers show that about 1%-2% of all Mg atoms are ionized at room temperature. The hole mobility depends strongly on the hole concentration, varying from mu_p = 24 cm2/ Vs for p = 1.8 x 10E17 cm-3 to mu_p = 7.5 cm2/ Vs for p = 1.4 x 10E18 cm-3 . We have carried extensive studies on the polarity inversion that results from Mg-doping. We show that under N-rich conditions, the polarity can be completed inverted by Mg, whereas Ga-rich conditions result in the formation of 'spiked-shape' inversion domains.