References

1

G D Watkins, Physica B117-B118, 9 (1983).

2

B. Bech Nielsen, L. Hoffmann, M. Budde, R. Jones, J. Goss, and S. Öberg, Materials Science Forum 196-201, 933, (1995).

3

S J Pearton and A J Tavendale, Phys. Rev B26, 7105 (1982).

4

J W  Petersen and J Nielsen, Appl. Phys. Lett. 56, 1122 (1990).

5

M Kleverman, A Thilderkvist, G Grossman, H G Grimmeiss and G D Watkins, Sol. State Commun. 93, 383 (1983).

6

G D Watkins and M Kleverman, Phys. Rev. Lett. 67, 1149 (1990).

7

G D Watkins and P M Williams, Phys. Rev. B52, 16575 (1995).

8

P R Briddon (To be published).

9

W Jost and J Weber, Phys. Rev B54, 11038 (1996); W Jost, J Weber and H Lemke, Semicond. Sci. Technol.  11, 22 (1996).

10

E Ö Sveinbjörnsson and O Engström, Phys. Rev. B52, 4884 (1995).

11

J A Davidson and J H Evans, Semicond. Sci. Technol. 11, 1704 (1996).

12

To appear in Identification of Defects in Semiconductors, edited by M Stavola and Semiconductors and Semimetals, treatise editors, R. K.  Willardson, A C Beer and E R Weber (Academic Press).

13

R Jones, S Öberg, J Goss, P R Briddon and A Resende, Phys. Rev. Lett. 75, 2734 (1995).

14

A Resende, R Jones, S Öberg, P R Briddon and B R Eggen (unpublished)

15

J Goss, A Resende, R Jones, S Oberg and P R Briddon, Materials Science Forum 196-201, 67-72, (1995).

16

J P Goss, R Jones, S J Breuer, P R Briddon and S Öberg, Phys Rev Lett 77, 3041 (1996).